Searched refs:TEST_SLOT_1 (Results 1 – 1 of 1) sorted by relevance
110 private static final int TEST_SLOT_1 = 1; field in SimultaneousCallingRestrictionsTest174 sMockModemManager.insertSimCard(TEST_SLOT_1, MOCK_SIM_PROFILE_ID_TWN_FET); in beforeAllTests()175 waitForSimStateReadyOrTimeout(TEST_SLOT_1); in beforeAllTests()177 sTestSubSlot1 = waitForActiveSubIdOrTimeout(TEST_SLOT_1); in beforeAllTests()201 sServiceConnectorSlot1.clearAllActiveImsServices(TEST_SLOT_1); in beforeAllTests()246 sMockModemManager.removeSimCard(TEST_SLOT_1); in afterAllTests()280 || sTelephonyManager.getSimState(TEST_SLOT_1) != TelephonyManager.SIM_STATE_READY in beforeTest()289 int subId_1 = SubscriptionManager.getSubscriptionId(TEST_SLOT_1); in beforeTest()325 setSimultaneousCallingEnabledLogicalSlots(new int[]{TEST_SLOT_0, TEST_SLOT_1}); in testCellularDSDASupported_IMSNotRegistered()366 setSimultaneousCallingEnabledLogicalSlots(new int[]{TEST_SLOT_0, TEST_SLOT_1}); in testCellularDSDASupported_ImsRegisteredWWAN()[all …]